1. System-on-chip test architectures : nanometer design for testability
پدیدآورنده : edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
کتابخانه: Library of Institute for Research in Fundamental Sciences (Tehran)
موضوع : Testing ، Systems on a chip,Testing ، Integrated circuits -- Very large scale integration,Design ، Integrated circuits -- Very large scale integration
رده :
TK
7895
.
E42S97
2. System-on-chip test architectures: nanometer design for testability
پدیدآورنده :
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : Testing ، Systems on a chip,Testing ، Integrated circuits-- Very large scale integration,، Integrated circuits-- Very large scale integration-- Design
رده :
TK
7895
.
E42
.
S978
2008